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On-line Access: 2017-12-04

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Citations:  Bibtex RefMan EndNote GB/T7714

 ORCID:

Jian Hao

http://orcid.org/0000-0002-2419-2508

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Frontiers of Information Technology & Electronic Engineering  2017 Vol.18 No.10 P.1678-1678

http://doi.org/10.1631/FITEE.15e0483


Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps


Author(s):  Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu

Affiliation(s):  University of Chinese Academy of Sciences, Beijing 100049, China; more

Corresponding email(s):   sunq@ciomp.ac.cn

Key Words:  LED lamp, Accelerated aging test, Medium lifetime, Moving average error


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Jian Hao, Lei Jing, Hong-liang Ke, Yao Wang, Qun Gao, Xiao-xun Wang, Qiang Sun, Zhi-jun Xu. Erratum to: Determination of cut-off time of accelerated aging test under temperature stress for LED lamps[J]. Frontiers of Information Technology & Electronic Engineering, 2017, 18(10): 1678-1678.

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journal="Frontiers of Information Technology & Electronic Engineering",
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number="10",
pages="1678-1678",
year="2017",
publisher="Zhejiang University Press & Springer",
doi="10.1631/FITEE.15e0483"
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Abstract: 


Erratum to: Front. Inform. Technol. Electron. Eng., 2017 18(8):1197-1204. doi:10.1631/FITEE.1500483

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