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Journal of Zhejiang University SCIENCE A 2003 Vol.4 No.4 P.448-453

http://doi.org/10.1631/jzus.2003.0448


Reliability Analysis of DOOF for Weibull Distribution


Author(s):  CHEN Wen-hua, CUI Jie, FAN Xiao-yan, LU Xian-biao, XIANG Ping

Affiliation(s):  The State Key Laboratory of Fluid Power Transmission and Control, Zhejiang University, Hangzhou 310027, China; more

Corresponding email(s):   chen-wenhua@sohu.com

Key Words:  DOOF data, Hierarchical Bayesian estimate, Reliability analysis


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CHEN Wen-hua, CUI Jie, FAN Xiao-yan, LU Xian-biao, XIANG Ping. Reliability Analysis of DOOF for Weibull Distribution[J]. Journal of Zhejiang University Science A, 2003, 4(4): 448-453.

@article{title="Reliability Analysis of DOOF for Weibull Distribution",
author="CHEN Wen-hua, CUI Jie, FAN Xiao-yan, LU Xian-biao, XIANG Ping",
journal="Journal of Zhejiang University Science A",
volume="4",
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pages="448-453",
year="2003",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2003.0448"
}

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%A CHEN Wen-hua
%A CUI Jie
%A FAN Xiao-yan
%A LU Xian-biao
%A XIANG Ping
%J Journal of Zhejiang University SCIENCE A
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%P 448-453
%@ 1869-1951
%D 2003
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2003.0448

TY - JOUR
T1 - Reliability Analysis of DOOF for Weibull Distribution
A1 - CHEN Wen-hua
A1 - CUI Jie
A1 - FAN Xiao-yan
A1 - LU Xian-biao
A1 - XIANG Ping
J0 - Journal of Zhejiang University Science A
VL - 4
IS - 4
SP - 448
EP - 453
%@ 1869-1951
Y1 - 2003
PB - Zhejiang University Press & Springer
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DOI - 10.1631/jzus.2003.0448


Abstract: 
Hierarchical Bayesian method for estimating the failure probability pi under DOOF by taking the quasi-Beta distribution B(pi-1,1,1,b) as the prior distribution is proposed in this paper. The weighted Least Squares Estimate method was used to obtain the formula for computing reliability distribution parameters and estimating the reliability characteristic values under DOOF. Taking one type of aerospace electrical connector as an example, the correctness of the above method through statistical analysis of electrical connector accelerated life test data was verified.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Reference

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