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CLC number: TN141

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Received: 2005-01-18

Revision Accepted: 2005-05-18

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Journal of Zhejiang University SCIENCE A 2005 Vol.6 No.7 P.722~727

http://doi.org/10.1631/jzus.2005.A0722


Constant-step stress accelerated life test of VFD under Weibull distribution case


Author(s):  ZHANG Jian-ping, GENG Xin-min

Affiliation(s):  Department of Information & Electronic Engineering, Zhejiang University, Hangzhou 310027, China; more

Corresponding email(s):   jpzhanglzu@163.com

Key Words:  Vacuum Fluorescent Display, Accelerated life test, Constant-step, Weibull, Average life


ZHANG Jian-ping, GENG Xin-min. Constant-step stress accelerated life test of VFD under Weibull distribution case[J]. Journal of Zhejiang University Science A, 2005, 6(7): 722~727.

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author="ZHANG Jian-ping, GENG Xin-min",
journal="Journal of Zhejiang University Science A",
volume="6",
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pages="722~727",
year="2005",
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doi="10.1631/jzus.2005.A0722"
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%T Constant-step stress accelerated life test of VFD under Weibull distribution case
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%A GENG Xin-min
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%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2005.A0722

TY - JOUR
T1 - Constant-step stress accelerated life test of VFD under Weibull distribution case
A1 - ZHANG Jian-ping
A1 - GENG Xin-min
J0 - Journal of Zhejiang University Science A
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SP - 722
EP - 727
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Y1 - 2005
PB - Zhejiang University Press & Springer
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DOI - 10.1631/jzus.2005.A0722


Abstract: 
constant-step stress accelerated life test of vacuum Fluorescent Display (VFD) was conducted with increased cathode temperature. Statistical analysis was done by applying weibull distribution for describing the life, and Least Square Method (LSM) for estimating weibull parameters. Self-designed special software was used to predict the VFD life. Numerical results showed that the average life of VFD is over 30000 h, that the VFD life follows weibull distribution, and that the life-stress relationship satisfies linear Arrhenius equation completely. Accurate calculation of the key parameter enabled rapid estimation of VFD life.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Reference

[1] Khamis, I.H., Higgins, J.J., 1998. A new model for step-stress testing. IEEE Transactions on Reliability, 47(2):131-134.

[2] Nelson, W., 1980. Accelerated life testing-step-stress models and data analyses. IEEE Transactions on Reliability, R-29:103-108.

[3] Park, S.J., Ha, J.S., Choi, J.S., Park, S.D., 2002. Improving the Reliability of a Newly-designed Mobile Phone by Environmental Tests and Accelerated of Tests. Proceedings Annual Reliability and Maintainability Symposium, p.642-646.

[4] Soman, K.P., Misra, K.B., 1992. Least square estimation of three parameters of a Weibull estimation. Microelectronics and Reliability, 32(3):303-305.

[5] Tebbi, O., Guérin, F., Dumon, B., 2003. Statistical Analysis of Accelerated Experiments in Mechanics Using a Mechanical Accelerated Life Model. Proceedings Annual Reliability and Maintainability Symposium, p.124-130.

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