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Journal of Zhejiang University SCIENCE A 2007 Vol.8 No.3 P.384~392

http://doi.org/10.1631/jzus.2007.A0384


Failure analysis of a kind of low power connector


Author(s):  ZHOU Yi-lin, ZENG Ning, XU Liang-jun, JÖ,RGENS Stefan

Affiliation(s):  Research Lab of Electric Contacts, Beijing University of Posts & Telecommunications, Beijing 100876, China; more

Corresponding email(s):   ylzhou@bupt.edu.cn, joergens.stefan@lumberg.de

Key Words:  Connector, Thermal failure, Fretting, Contamination


ZHOU Yi-lin, ZENG Ning, XU Liang-jun, JÖRGENS Stefan. Failure analysis of a kind of low power connector[J]. Journal of Zhejiang University Science A, 2007, 8(3): 384~392.

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author="ZHOU Yi-lin, ZENG Ning, XU Liang-jun, JÖRGENS Stefan",
journal="Journal of Zhejiang University Science A",
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pages="384~392",
year="2007",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2007.A0384"
}

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%A ZENG Ning
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%A JÖ
%A RGENS Stefan
%J Journal of Zhejiang University SCIENCE A
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%@ 1673-565X
%D 2007
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2007.A0384

TY - JOUR
T1 - Failure analysis of a kind of low power connector
A1 - ZHOU Yi-lin
A1 - ZENG Ning
A1 - XU Liang-jun
A1 - JÖ
A1 - RGENS Stefan
J0 - Journal of Zhejiang University Science A
VL - 8
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SP - 384
EP - 392
%@ 1673-565X
Y1 - 2007
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2007.A0384


Abstract: 
A kind of low power connector used e.g. in household appliances was partly burned in routine experiment. The heat sources were four paralleled contacts constructed by springs (Sn/CuSn-alloy) in socket and a plug sheet (Ni/Steel) while mating. The contact interfaces were detected by scanning electronic microscope (SEM) and X-ray energy dispersive spectroscopy (XEDS), obvious wear tracks and various contaminants, including element Si, Al, Na, K, S, Cl, O, etc., were found. The contamination degrees on the four paralleled contacts were different, so that the ratio of average contact resistance on the four contacts was about 5:8:3:1. The maximum contact resistance on contacts of the plug sheet reached 28 Ω. The main failure reasons were fretting and contamination between the contact interfaces. fretting simulation showed that connection resistance of connectors was raised up, even to ohms level. When the current increased to 5 A, the socket housing was heated and decomposed. By the thermal analysis, it was estimated that the connector would be burned under the lower current if the current was not evenly distributed on the four paralleled contacts caused by uneven contamination. Improvement methods for connector failure are also discussed.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Reference

[1] Antler, M., 1995. Corrosion Control and Lubrication of Plated Noble Metal Connector Contacts. Proc. of IEEE Holm Conference on Electrical Contacts, p.83-96.

[2] Antler, M., Drozdowicz, M.H., 1981-1982. Fretting corrosion of gold-plated connector contacts. Wear, 74:27-50.

[3] Braunovic, M., 1991. Evaluation of Different Platings for Aluminum-to-copper Connections. Proc. of IEEE Holm Conference on Electrical Contacts, p.249-260.

[4] Lee, A., Mamrick, M.S., 1987. Fretting corrosion of tin plated copper alloy. IEEE Transaction on CHMT, CHMT-10(1):63-67.

[5] Neufeld, C.N., Rieder, W.F., 2005. Electrical Characteristics of Various Contact Contaminations. Proc. of IEEE Holm Conference on Electrical Contacts, p.255-258.

[6] Zhou, Y.L., Lin, X.Y., Zhang, J.G., 2000a. The Electrical and Mechanical Performance of Corroded Products on Gold Plating after Long Term Indoor Air Exposure. Proc. of IEEE Holm Conference on Electrical Contacts, p.18-26.

[7] Zhou, Y.L., Lin, X.Y., Zhang, J.G., 2000b. Electric Contact Behavior of Various Plating after Long Term Indoor Air Exposure. Proc. of 20th International Conference on Electrical Contacts, p.313-318.

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