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Journal of Zhejiang University SCIENCE A 2004 Vol.5 No.1 P.86~91


Inversion of thicknesses of multi-layered structures from eddy current testing measurements

Author(s):  HUANG Ping-jie, WU Zhao-tong

Affiliation(s):  Institute of Advanced Manufacturing Engineering, Zhejiang University, Hangzhou 310027, China

Corresponding email(s):   vamadis@yahoo.com.cn

Key Words:  Multi-layered structure, Thickness measurement, Eddy current testing, Multi-frequency, Inversion

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HUANG Ping-jie, WU Zhao-tong. Inversion of thicknesses of multi-layered structures from eddy current testing measurements[J]. Journal of Zhejiang University Science A, 2004, 5(1): 86~91.

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A1 - HUANG Ping-jie
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Luquire et al.'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article


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[6] Rekanos, I.T., Theodoulidis, T.P., Panas, S.M., Tsiboukis,T.D., 1997. Impedance inversion in eddy current testing of layered planar structures via neural networks. NDT&E International, 30(2):69-74.

[7] Wu, Z.T., and Huang, P.J., 2002. Impedance Model Simulation and Verification of Thickness Multi-layered Structure Measurement using Eddy Current Method. Proceedings of the 4th Symposium on Metrological Science and Technology, Taiwan, c11:1-7.

[8] Yan, R.C., 1996. Thickness measurement using eddy current method. Nondestructive Testing, 18(6):169-172.

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