Full Text:   <1165>

CLC number: TP391.7;TM13

On-line Access: 

Received: 2003-03-11

Revision Accepted: 2003-07-03

Crosschecked: 0000-00-00

Cited: 4

Clicked: 2889

Citations:  Bibtex RefMan EndNote GB/T7714

-   Go to

Article info.
1. Reference List
Open peer comments

Journal of Zhejiang University SCIENCE A 2004 Vol.5 No.1 P.86~91

http://doi.org/10.1631/jzus.2004.0086


Inversion of thicknesses of multi-layered structures from eddy current testing measurements


Author(s):  HUANG Ping-jie, WU Zhao-tong

Affiliation(s):  Institute of Advanced Manufacturing Engineering, Zhejiang University, Hangzhou 310027, China

Corresponding email(s):   vamadis@yahoo.com.cn

Key Words:  Multi-layered structure, Thickness measurement, Eddy current testing, Multi-frequency, Inversion


Share this article to: More

HUANG Ping-jie, WU Zhao-tong. Inversion of thicknesses of multi-layered structures from eddy current testing measurements[J]. Journal of Zhejiang University Science A, 2004, 5(1): 86~91.

@article{title="Inversion of thicknesses of multi-layered structures from eddy current testing measurements",
author="HUANG Ping-jie, WU Zhao-tong",
journal="Journal of Zhejiang University Science A",
volume="5",
number="1",
pages="86~91",
year="2004",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2004.0086"
}

%0 Journal Article
%T Inversion of thicknesses of multi-layered structures from eddy current testing measurements
%A HUANG Ping-jie
%A WU Zhao-tong
%J Journal of Zhejiang University SCIENCE A
%V 5
%N 1
%P 86~91
%@ 1869-1951
%D 2004
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2004.0086

TY - JOUR
T1 - Inversion of thicknesses of multi-layered structures from eddy current testing measurements
A1 - HUANG Ping-jie
A1 - WU Zhao-tong
J0 - Journal of Zhejiang University Science A
VL - 5
IS - 1
SP - 86
EP - 91
%@ 1869-1951
Y1 - 2004
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2004.0086


Abstract: 
Luquire et al.'s impedance change model of a rectangular cross section probe coil above a structure with an arbitrary number of parallel layers was used to study the principle of measuring thicknesses of multi-layered structures in terms of eddy current testing voltage measurements. An experimental system for multi-layered thickness measurement was developed and several fitting models to formulate the relationships between detected impedance/voltage measurements and thickness are put forward using least square method. The determination of multi-layered thicknesses was investigated after inversing the voltage outputs of the detecting system. The best fitting and inversion models are presented.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Reference

[1] American Society for Nondestructive Testing, 1998. Nondestructive Testing Handbook, Electromagnetic, Edition 4.

[2] Cheng, C.C., Dodd, C.V. and Deeds, W.E., 1971. General analysis of probe coils near stratified conductors. Int. J. Nondestr. Test, 3:109-130.

[3] Huang, P.J. and Wu, Z.T., 2002. Thickness measurement of multi-layered structure by eddy current testing. Proceedings of ISIST'2002, The Press in Harbin Insititute of Technology, Harbin, 5:38-42.

[4] Luquire, J.W., Deeds, W.E. and Dodd, C.V., 1970. Alternating current distribution between planar conductors. Journal of Applied Physics, 41(10):3983-3991.

[5] Oystein, B., 1993. Model-based inversion of plate thickness and liftoff from eddy current probe coil measurements. Materials Evaluation, Jan:72-76.

[6] Rekanos, I.T., Theodoulidis, T.P., Panas, S.M., Tsiboukis,T.D., 1997. Impedance inversion in eddy current testing of layered planar structures via neural networks. NDT&E International, 30(2):69-74.

[7] Wu, Z.T., and Huang, P.J., 2002. Impedance Model Simulation and Verification of Thickness Multi-layered Structure Measurement using Eddy Current Method. Proceedings of the 4th Symposium on Metrological Science and Technology, Taiwan, c11:1-7.

[8] Yan, R.C., 1996. Thickness measurement using eddy current method. Nondestructive Testing, 18(6):169-172.

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952783; E-mail: cjzhang@zju.edu.cn
Copyright © 2000 - Journal of Zhejiang University-SCIENCE