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Journal of Zhejiang University SCIENCE A 2008 Vol.9 No.10 P.1398~1405

http://doi.org/10.1631/jzus.A0720130


A recoverable stress testing algorithm for compression and encryption cards


Author(s):  Bao-jun ZHANG, Xue-zeng PAN, Jie-bing WANG, Ling-di PING

Affiliation(s):  Network and Security Lab, School of Computer Science and Technology, Zhejiang University, Hangzhou 310027, China

Corresponding email(s):   zbjhover@zju.edu.cn

Key Words:  Stress testing, Random sequence, Chaos function, Synchronization, Concurrency


Bao-jun ZHANG, Xue-zeng PAN, Jie-bing WANG, Ling-di PING. A recoverable stress testing algorithm for compression and encryption cards[J]. Journal of Zhejiang University Science A, 2008, 9(10): 1398~1405.

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Abstract: 
This study proposes a recoverable stress testing algorithm (RSTA) for such special devices as compression/decompression card and encryption/decryption card. It uses a chaos function to generate a random sequence, and then, according to the random sequence, generates an effective command sequence. The dispatch of command obeys a special schedule strategy we designed for such devices, i.e., the commands are sent according to the command sequence, and the complete commands are put in a buffer for further result check. RSTA is used to test the HIFN compression acceleration card SAICHI-1000. Test results show that RSTA can make the card work continuously and adequately.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

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