
Chenglong SUN1,2, Yanqing ZHOU1,2, Qi WANG3*, Yan ZHANG1,2. A hybrid redundancy and serialization fault-tolerant architecture for through-silicon via interconnects[J]. Journal of Zhejiang University Science ,in press.Frontiers of Information Technology & Electronic Engineering,in press.https://doi.org/10.1631/ENG.ITEE.2025.0156 @article{title="A hybrid redundancy and serialization fault-tolerant architecture for through-silicon via interconnects", %0 Journal Article TY - JOUR
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ReferenceCLC number: On-line Access: 2026-05-07 Received: 2025-11-26 Revision Accepted: 2026-04-15 Crosschecked: 0000-00-00 Cited: 0 Clicked: 17 Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou
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