
CLC number: TP316
On-line Access: 2024-08-27
Received: 2023-10-17
Revision Accepted: 2024-05-08
Crosschecked: 2018-02-15
Cited: 0
Clicked: 9490
Wen-zhe Zhang, Kai Lu, Xiao-ping Wang. Versionized process based on non-volatile random-access memory for fine-grained fault tolerance[J]. Frontiers of Information Technology & Electronic Engineering,in press.https://doi.org/10.1631/FITEE.1601477 @article{title="Versionized process based on non-volatile random-access memory for fine-grained fault tolerance", %0 Journal Article TY - JOUR
基于非易失存储器的版本化进程细粒度容错关键词组: Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article
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