Full Text:   <1252>

CLC number: O641.3

On-line Access: 

Received: 2005-07-26

Revision Accepted: 2005-11-10

Crosschecked: 0000-00-00

Cited: 1

Clicked: 3079

Citations:  Bibtex RefMan EndNote GB/T7714

-   Go to

Article info.
1. Reference List
Open peer comments

Journal of Zhejiang University SCIENCE B 2006 Vol.7 No.4 P.304~309

http://doi.org/10.1631/jzus.2006.B0304


A novel colloid probe preparation method based on chemical etching technique


Author(s):  Xu Hui, Xu Guo-Hua, An Yue

Affiliation(s):  Department of Chemical Engineering, Zhejiang University, Hangzhou 310027, China

Corresponding email(s):   xugh@zju.edu.cn

Key Words:  Hydrophobic force, Atomic force microscope (AFM), Colloid probe, Chemical etching


Xu Hui, Xu Guo-Hua, An Yue. A novel colloid probe preparation method based on chemical etching technique[J]. Journal of Zhejiang University Science B, 2006, 7(4): 304~309.

@article{title="A novel colloid probe preparation method based on chemical etching technique",
author="Xu Hui, Xu Guo-Hua, An Yue",
journal="Journal of Zhejiang University Science B",
volume="7",
number="4",
pages="304~309",
year="2006",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2006.B0304"
}

%0 Journal Article
%T A novel colloid probe preparation method based on chemical etching technique
%A Xu Hui
%A Xu Guo-Hua
%A An Yue
%J Journal of Zhejiang University SCIENCE B
%V 7
%N 4
%P 304~309
%@ 1673-1581
%D 2006
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2006.B0304

TY - JOUR
T1 - A novel colloid probe preparation method based on chemical etching technique
A1 - Xu Hui
A1 - Xu Guo-Hua
A1 - An Yue
J0 - Journal of Zhejiang University Science B
VL - 7
IS - 4
SP - 304
EP - 309
%@ 1673-1581
Y1 - 2006
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2006.B0304


Abstract: 
Several fundamental problems in hydrophobic force measurements using atomic force microscope (AFM) are discussed in this paper. A novel method for colloid probe preparation based on chemical etching technology is proposed, which is specially fit for the unique demands of hydrophobic force measurements by AFM. The features of three different approaches for determining spring constants of rectangular cantilevers, including geometric dimension, Cleveland and Sader methods are compared. The influences of the sizes of the colloids on the measurements of the hydrophobic force curves are investigated. Our experimental results showed that by selecting colloid probe with proper spring constant and tip size, the hydrophobic force and the complete hydrophobic interaction force curve can be measured by using AFM.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Reference

[1] Cleveland, J.P., Manne, I., Bocek, D., Hansma, P.K., 1993. A nondestructive method for determining the spring constant of cantilevers for scanning force microscopy. Rev. Sci. Instrum., 64(2):403-405.

[2] Ducker, W.A., Senden, T.J., Pashley, R.M., 1991. Direct measurement of colloidal forces using an atomic force microscope. Nature, 353(6341):239-241.

[3] Ishida, N., Sakamoto, M., Miyahara, M., Higashitani, K., 2001. Static method to evaluate interaction force by AFM. Journal of Colloid and Interface Science, 235(1):190-192.

[4] Ishida, N., Sakamoto, M., Miyahara, M., Higashitani, K., 2002. Optical observation of gas bridging between hydrophobic surfaces in water. Journal of Colloid and Interface Science, 253(1):112-116.

[5] Israelachvili, J.N., 1992. Intermolecular and Surface Forces, 2nd Ed. Academic Press, London, p.315.

[6] Israelachvili, J.N., Pashley, R.M., 1982. The hydrophobic interaction is long range, decaying exponentially with distance. Nature, 300(5890):341-342.

[7] Johnson, K.L., Kendall, K., Roberts, A.D., 1971. Surface energy and the contact of elastic solids. Proc. Roy. Soc., Ser A, 324:301-313.

[8] Madou, M.T., 1997. Fundamentals of Microfabrication. CRC Press, Boca Raton, FL.

[9] Meyer, E.E., Lin, Q., Israelachvili, J.N., 2005. Effects of dissolved gas on the hydrophobic attraction between surfactant-coated surfaces. Langmuir, 21(1):256-259.

[10] Rabinovich, Y.I., Yoon, R.H., 1994. Use of atomic force microscope for the measurement of hydrophobic force between silanated silica plate and glass sphere. Langmuir, 10(6):1903-1909.

[11] Sader, J.E., Larson, I., Mulvaney, P., 1995. Method for the calibration of atomic force microscope cantilevers. Rev. Sci. Instrum., 66(7):3789-3798.

[12] Sader, J.E., Chon, J.W.M., Mulvaney, P., 1999. Calibration of rectangular atomic force microscope cantilevers. Rev. Sci. Instrum., 70(10):3967-3969.

[13] Schwartz, B., Robbins, H., 1976. Chemical etching of silicon. J. Electrochem. Soc., 123(12):1903-1909.

[14] Stokey, W.F., 1989. Shock and Vigration Handbook. McGraw-Hill, New York, p.7.1-7.44.

[15] Xu, G.H., Higashitani, K., 2000. Formation of OTS self-assembled monolayer on glass surface investigated by AFM. Journal of Zhejiang University SCIENCE, 1(2):162-170.

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952783; E-mail: cjzhang@zju.edu.cn
Copyright © 2000 - Journal of Zhejiang University-SCIENCE