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CLC number: TN248.1

On-line Access: 2015-04-03

Received: 2015-02-15

Revision Accepted: 2015-03-09

Crosschecked: 2015-03-25

Cited: 2

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Citations:  Bibtex RefMan EndNote GB/T7714


Sha Wang


Guo-ying Feng


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Journal of Zhejiang University SCIENCE A 2015 Vol.16 No.4 P.326-334


SESAM fabrication errors and its influence on ultrafast laser cavity design

Author(s):  Sha Wang, Guo-ying Feng, Shou-huan Zhou

Affiliation(s):  Institute of Laser & Micro/Nano Engineering, College of Electronics and Information Engineering, Sichuan University, Chengdu 610064, China; more

Corresponding email(s):   guoingfeng@scu.edu.cn, zhoush@scu.edu.cn

Key Words:  Semiconductor saturable absorber mirror (SESAM), Ultrafast laser, Fabrication error, Design criteria

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Sha Wang, Guo-ying Feng, Shou-huan Zhou. SESAM fabrication errors and its influence on ultrafast laser cavity design[J]. Journal of Zhejiang University Science A, 2015, 16(4): 326-334.

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During mode-locked ultrafast laser experiments, we find that semiconductor saturable absorber mirrors (SESAMs) from the same manufacturing process may, from batch to batch, show different working ranges: pure Q-switching, Q-switched mode-locking, and continuous wave (CW) mode-locking. This is because, in high-volume wafer-scale fabrication, there is typically an estimated 1% error for high-quality molecular beam epitaxy (MBE) growth, which introduces a variation in the parameters of an individual SESAM. In this paper, we will analyze how that 1% error in layer thickness influences the behaviour of SESAMs in three different structures: resonant SESAM, anti-resonant SESAM, and enhanced SESAM. Furthermore, the characteristics of the SESAM will affect the mode-locking dynamic behavior of ultrafast solid state lasers. In the worst case, a SESAM with a fabrication error may prevent the laser cavity from mode-locking. Proper laser cavity design can help to reduce the impact of SESAM fabrication errors on laser performance and maintain the laser in the CW mode-locking range.

SESAM was one of the most important attractive inventions and key component on generating ultrafast pulses, however people have been focusing on how to design, improve and optimize the SESAM to meet its application in both bulk crystals and fiber based mode-locking, few people work on the fabrication errors of SESAM that may affect the mode-locking falling into one of the categories: Q-Switching or Q-Switching mode-locking. Theoretically the authors simulate all parameters of three types of SESAM structures with thickness errors, and raise a criteria in cavity design to tolerate the manufacturing error impact.




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