Full Text:   <4491>

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CLC number: TN713; O441; O484

On-line Access: 2021-11-15

Received: 2020-12-10

Revision Accepted: 2021-03-30

Crosschecked: 2021-10-12

Cited: 0

Clicked: 5729

Citations:  Bibtex RefMan EndNote GB/T7714


Yilei Zhang


Zhengang Lu


Heyan Wang


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Frontiers of Information Technology & Electronic Engineering  2021 Vol.22 No.11 P.1532-1540


Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films

Author(s):  Yilei Zhang, Jinxuan Cao, Zhengang Lu, Heyan Wang, Jiubin Tan

Affiliation(s):  Center of Ultra-precision Optoelectronic Instrument Engineering, Harbin Institute of Technology, Harbin 150080, China; more

Corresponding email(s):   luzhengang@hit.edu.cn

Key Words:  Metallic mesh, Technique for order preference by similarity to ideal solution (TOPSIS), Entropy weight (EW), Comprehensive evaluation, Transparent conductive films

Yilei Zhang, Jinxuan Cao, Zhengang Lu, Heyan Wang, Jiubin Tan. Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films[J]. Frontiers of Information Technology & Electronic Engineering, 2021, 22(11): 1532-1540.

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author="Yilei Zhang, Jinxuan Cao, Zhengang Lu, Heyan Wang, Jiubin Tan",
journal="Frontiers of Information Technology & Electronic Engineering",
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%0 Journal Article
%T Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films
%A Yilei Zhang
%A Jinxuan Cao
%A Zhengang Lu
%A Heyan Wang
%A Jiubin Tan
%J Frontiers of Information Technology & Electronic Engineering
%V 22
%N 11
%P 1532-1540
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%D 2021
%I Zhejiang University Press & Springer
%DOI 10.1631/FITEE.2000690

T1 - Comprehensive evaluation factor of optoelectronic properties for transparent conductive metallic mesh films
A1 - Yilei Zhang
A1 - Jinxuan Cao
A1 - Zhengang Lu
A1 - Heyan Wang
A1 - Jiubin Tan
J0 - Frontiers of Information Technology & Electronic Engineering
VL - 22
IS - 11
SP - 1532
EP - 1540
%@ 2095-9184
Y1 - 2021
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/FITEE.2000690

Finding the optimal optoelectronic properties (zero-order optical transmittance, shielding effectiveness, and stray light uniformity) of metallic mesh is significant for its application in electromagnetic interference shielding areas. However, there are few relevant studies at present. Based on optoelectronic properties, we propose a comprehensive evaluation factor Q, which is simple in form and can be used to evaluate the mesh with different parameters in a simple and efficient way. The effectivity of Q is verified by comparing the trend of Q values with the evaluation results of the technique for order preference by similarity to ideal solution (TOPSIS). The evaluation factor Q can also be extended to evaluate the optoelectronic properties of different kinds of metallic meshes, which makes it extremely favorable for metallic mesh design and application.




Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article


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