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Journal of Zhejiang University SCIENCE B 2005 Vol.6 No.5 P.311~318

10.1631/jzus.2005.B0311


Accumulation and ultrastructural distribution of copper in Elsholtzia splendens


Author(s):  PENG Hong-yun, YANG Xiao-e, TIAN Sheng-ke

Affiliation(s):  Ministry of Education Key Lab of Environment, Remediation and Ecosystem Health, School of Natural Resources and Environmental Science, Zhejiang University, Hangzhou 310029, China

Corresponding email(s):   penghongyun@zju.edu.cn, xyang@zju.edu.cn

Key Words:  Cell wall, Chloroplast, Cu detoxification, Elsholtzia splendens, Ultrastructural distribution


PENG Hong-yun, YANG Xiao-e, TIAN Sheng-ke. Accumulation and ultrastructural distribution of copper in Elsholtzia splendens[J]. Journal of Zhejiang University Science B, 2005, 6(5): 311~318.

@article{title="Accumulation and ultrastructural distribution of copper in Elsholtzia splendens",
author="PENG Hong-yun, YANG Xiao-e, TIAN Sheng-ke",
journal="Journal of Zhejiang University Science B",
volume="6",
number="5",
pages="311~318",
year="2005",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2005.B0311"
}

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%T Accumulation and ultrastructural distribution of copper in Elsholtzia splendens
%A PENG Hong-yun
%A YANG Xiao-e
%A TIAN Sheng-ke
%J Journal of Zhejiang University SCIENCE B
%V 6
%N 5
%P 311~318
%@ 1673-1581
%D 2005
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2005.B0311

TY - JOUR
T1 - Accumulation and ultrastructural distribution of copper in Elsholtzia splendens
A1 - PENG Hong-yun
A1 - YANG Xiao-e
A1 - TIAN Sheng-ke
J0 - Journal of Zhejiang University Science B
VL - 6
IS - 5
SP - 311
EP - 318
%@ 1673-1581
Y1 - 2005
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2005.B0311


Abstract: 
Copper accumulation and intracellular distribution in Elsholtzia splendens, a native Chinese Cu-tolerant and accumulating plant species, was investigated by transmission electron microscope (TEM) and gradient centrifugation techniques. Copper concentrations in roots, stems and leaves of E. splendens increased with increasing Cu levels in solution. After exposure to 500 μmol/L Cu for 8 d, about 1000 mg/kg Cu were accumulated in the stem and 250 mg/kg Cu in the leaf of E. splendens. At 50 μmol/L Cu, no significant toxicity was observed in the chloroplast and mitochondrion within its leaf cells, but separation appeared at the cytoplasm and the cell wall within the root cells. At >250 μmol/L Cu, both root and leaf cell organelles in E. splendens were damaged heavily by excessive Cu in vivo. Copper subcellular localization in the plant leaf after 8 days’ exposure to 500 μmol/L Cu using gradient centrifugation techniques was found to be decreased in the order: chloroplast>cell wall>soluble fraction>other organelles. The plant root cell wall was found to be the site of highest Cu localization. Increase of Cu exposure time from 8 d to 16 d, increased slightly Cu concentration in cell wall fraction in roots and leaves, while that in the chloroplast fraction decreased in leaves of the plants grown in both 0.25 μmol/L and 500 μmol/L Cu. TEM confirmed that much more Cu localized in cell walls of E. splendens roots and leaves, but also more Cu localized in E. splendenschloroplast when the plant is exposed to Cu levels>250 μmol/L, as compared to those in the plant grown in 0.25 μmol/L Cu. Copper treatment at levels>250 μmol/L caused pronounced damage in the leaf chloroplast and root organelles. Copper localization in cell walls and chloroplasts could mainly account for the high detoxification of Cu in E. splendens.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

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