Full Text:   <1595>

CLC number: TB114.3; O224; O211.6

On-line Access: 

Received: 2006-12-19

Revision Accepted: 2007-01-05

Crosschecked: 0000-00-00

Cited: 1

Clicked: 3248

Citations:  Bibtex RefMan EndNote GB/T7714

-   Go to

Article info.
1. Reference List
Open peer comments

Journal of Zhejiang University SCIENCE A 2007 Vol.8 No.3 P.370~377

http://doi.org/10.1631/jzus.2007.A0370


Study on the instantaneous protection reliability of low voltage circuit breakers


Author(s):  LU Jian-guo, DU Tai-hang, LUO Yan-yan

Affiliation(s):  Electrical Apparatus Institute, Hebei University of Technology, Tianjin 300130, China

Corresponding email(s):   luoyy@hebut.edu.cn

Key Words:  Low voltage circuit breakers, Instantaneous protection reliability, Non-periodic component of current, Phase selective closing


LU Jian-guo, DU Tai-hang, LUO Yan-yan. Study on the instantaneous protection reliability of low voltage circuit breakers[J]. Journal of Zhejiang University Science A, 2007, 8(3): 370~377.

@article{title="Study on the instantaneous protection reliability of low voltage circuit breakers",
author="LU Jian-guo, DU Tai-hang, LUO Yan-yan",
journal="Journal of Zhejiang University Science A",
volume="8",
number="3",
pages="370~377",
year="2007",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2007.A0370"
}

%0 Journal Article
%T Study on the instantaneous protection reliability of low voltage circuit breakers
%A LU Jian-guo
%A DU Tai-hang
%A LUO Yan-yan
%J Journal of Zhejiang University SCIENCE A
%V 8
%N 3
%P 370~377
%@ 1673-565X
%D 2007
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2007.A0370

TY - JOUR
T1 - Study on the instantaneous protection reliability of low voltage circuit breakers
A1 - LU Jian-guo
A1 - DU Tai-hang
A1 - LUO Yan-yan
J0 - Journal of Zhejiang University Science A
VL - 8
IS - 3
SP - 370
EP - 377
%@ 1673-565X
Y1 - 2007
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2007.A0370


Abstract: 
This paper outlines the significance of enhancing the instantaneous protection reliability of low voltage circuit breakers and describes their main failure modes. The instantaneous failure mechanism of low voltage circuit breakers was analyzed so that measures to improve instantaneous protection reliability can be determined. Furthermore, the theory of the instantaneous characteristics calibration device for low voltage circuit breakers and the method of eliminating the non-periodic component of test current are given in detail. Finally, the test results are presented.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Reference

[1] Chen, G.B., 1989. Cryogenic Insulation and Heat Transfer. Zhejiang University Press, Hangzhou, p.240-256 (in Chinese).

[2] Chen, X.D., Zhu, Y.X., Wang, Y.Q., Qu, S., Gu, H., 2001. Reliability test research of moulded case circuit breaker and its application. Low Voltage Apparatus, (2):8-10 (in Chinese).

[3] Hanna, G.L., 1995. Retrofit breakers resolve trip failures. Power Engineering, 99(3):38-40.

[4] Lu, J.G., Li, Z.G., Wang, J.Q., 1990. The Device of Research on Relay Contact Reliability. Proceedings of the 36th IEEE Holm Conference on Electrical Contacts & the 15th International Conference on Electrical Contacts. International Conference and Tour Montreal, Quebec, Canada, p.102-109.

[5] National Standard GB14048.2-2001, 2002. Low Voltage Switchgear and Control Equipment: Low Voltage Circuit Breakers. Chinese Standards Press, Beijing (in Chinese).

[6] Norris, A., 1989. Report of Circuit Breaker Reliability Survey of Industrial and Commercial Installations. IEEE Conference Record of Industrial and Commercial Power Systems Technical Conference. Chicago, IL, USA, p.1-16.

[7] O’Donnell, P., Braun, W.F., Heising, C.R., Khera, P.P., Kornblit, M., McDonald, K.D., 1997. Survey results of low-voltage circuit breakers as found during maintenance testing: working group report. IEEE Transactions on Industry Applications, 33(5):1367-1369.

[8] Rieder, W.F., Strof, T.W., 1990. Relay Life Tests with Contact Resistance Measurement after Each Operation. Proceedings of the 36th IEEE Holm Conference on Electrical Contacts & the 15th International Conference on Electrical Contacts. International Conference and Tour Montreal, Quebec, Canada, p.73-78.

[9] Schoen, P.E., 1989a. Circuit breaker testing technology (Part 1). Electrical Manufacturing, 3(5):37-39.

[10] Schoen, P.E., 1989b. Circuit breaker testing technology (Part 2). Electrical Manufacturing, 3(6):21-24.

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952783; E-mail: cjzhang@zju.edu.cn
Copyright © 2000 - Journal of Zhejiang University-SCIENCE