Full Text:   <1618>

CLC number: TM7321

On-line Access: 

Received: 2006-12-19

Revision Accepted: 2007-01-05

Crosschecked: 0000-00-00

Cited: 2

Clicked: 3473

Citations:  Bibtex RefMan EndNote GB/T7714

-   Go to

Article info.
1. Reference List
Open peer comments

Journal of Zhejiang University SCIENCE A 2007 Vol.8 No.3 P.501~505

10.1631/jzus.2007.A0501


Application of the Bayes’ theory to the failure rate evaluation of electrical apparatus


Author(s):  JIN Shao-hua, LU Jian-guo, WAN Yan-ping, SUN Shu-guang

Affiliation(s):  Department of Mathematics, Hebei University of Technology, Tianjin 300130, China

Corresponding email(s):   jin_0510@126.com

Key Words:  Bayesian estimation, Failure rate, Least-squares method, Maximum likelihood principle, Mixed-Weibull distribution


JIN Shao-hua, LU Jian-guo, WAN Yan-ping, SUN Shu-guang. Application of the Bayes’ theory to the failure rate evaluation of electrical apparatus[J]. Journal of Zhejiang University Science A, 2007, 8(3): 501~505.

@article{title="Application of the Bayes’ theory to the failure rate evaluation of electrical apparatus",
author="JIN Shao-hua, LU Jian-guo, WAN Yan-ping, SUN Shu-guang",
journal="Journal of Zhejiang University Science A",
volume="8",
number="3",
pages="501~505",
year="2007",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2007.A0501"
}

%0 Journal Article
%T Application of the Bayes’ theory to the failure rate evaluation of electrical apparatus
%A JIN Shao-hua
%A LU Jian-guo
%A WAN Yan-ping
%A SUN Shu-guang
%J Journal of Zhejiang University SCIENCE A
%V 8
%N 3
%P 501~505
%@ 1673-565X
%D 2007
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2007.A0501

TY - JOUR
T1 - Application of the Bayes’ theory to the failure rate evaluation of electrical apparatus
A1 - JIN Shao-hua
A1 - LU Jian-guo
A1 - WAN Yan-ping
A1 - SUN Shu-guang
J0 - Journal of Zhejiang University Science A
VL - 8
IS - 3
SP - 501
EP - 505
%@ 1673-565X
Y1 - 2007
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2007.A0501


Abstract: 
The Weibull distribution has been widely used in reliability fields. A mixed Weibull distribution represents a population that consists of several Weibull subpopulations. In this paper, a new approach which combines the least-squares method with Bayes’ theorem, takes advantage of the parameter estimation for single Weibull distribution is developed to estimate the parameters of each subpopulation. The estimates given by this paper also satisfy the maximum likelihood equation. The estimates of the failure rate of the mixed Weibull population are given. An actual test data is computed by using the proposed method. The Kolmogorov-Smirnov goodness-of-fit test turns out that the proposed method yields more accurate result.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

Reference

[1] Kececioglu, D., 1993. Reliability and Life Testing Handbook 1. PTR Prentice Hall, New Jersey.

[2] Liu, B.Z., 2002a. Field survey and analysis on reliability of low voltage electrical apparatus. Low Voltage Electrical Apparatus, 2:11-13.

[3] Liu, B.Z., 2002b. Field survey and analysis on reliability of low voltage electrical apparatus (continued). Low Voltage Electrical Apparatus, 3:14-18.

[4] Lu, J.G., Su, X.P., 2003. Theory and Application of Reliability Optimization Design of Electromagnetic System on Electrical Apparatus. China Machine Press, Beijing (in Chinese).

[5] Mann, N.R., Schafer, R.E., Singpurwalla, N.D., 1974. Methods for Statistical Analysis of Reliability and Life Data. John Willey & Sons, New York, p.69-78.

[6] Nelson, W., 1990. Accelerated Testing-statistical Models, Test Plans, and Data Analysis. John Willey & Sons, New York.

[7] Weibull, W., 1951. A statistical distribution function of wide applicability. Journal of Applied Mechanics, 18:293-297.

Open peer comments: Debate/Discuss/Question/Opinion

<1>

Please provide your name, email address and a comment





Journal of Zhejiang University-SCIENCE, 38 Zheda Road, Hangzhou 310027, China
Tel: +86-571-87952783; E-mail: cjzhang@zju.edu.cn
Copyright © 2000 - Journal of Zhejiang University-SCIENCE