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Journal of Zhejiang University SCIENCE A 2009 Vol.10 No.4 P.613-618

http://doi.org/10.1631/jzus.A0820107


Atmospheric corrosion mapping of copper surfaces from diffuse light scattering measurements by an optoelectronic sensor system


Author(s):  Marimuthu PAULVANNA NAYAKI, Arunachalam P. KABILAN

Affiliation(s):  Department of Electronics and Communication Engineering, PSNA College of Engineering and Technology, Dindigul 624622, India; more

Corresponding email(s):   paulmn5@yahoo.com

Key Words:  Light scattering, Optoelectronic sensor, Atmospheric corrosion mapping


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Marimuthu PAULVANNA NAYAKI, Arunachalam P. KABILAN. Atmospheric corrosion mapping of copper surfaces from diffuse light scattering measurements by an optoelectronic sensor system[J]. Journal of Zhejiang University Science A, 2009, 10(4): 613-618.

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%A Arunachalam P. KABILAN
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T1 - Atmospheric corrosion mapping of copper surfaces from diffuse light scattering measurements by an optoelectronic sensor system
A1 - Marimuthu PAULVANNA NAYAKI
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PB - Zhejiang University Press & Springer
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DOI - 10.1631/jzus.A0820107


Abstract: 
A novel light scattering technique for mapping metal surface corrosion is presented and its results on copper exposed to atmosphere are reported. The front end of the instrument is made up of a sensor module comprising a thin beam light emitting diode (LED) illuminating a small spot on the metal surface, and a matched pair of photodetectors, one for capturing the reflected light and the other for sampling the scattered light. The analog photocurrent signals are digitized and processed online by a personal computer (PC) to determine the corrosion factor defined in terms of the two current values. By scanning the sample surface using the light beam and by computing the corrosion factor values simultaneously, a three dimensional graph and a two dimensional contour map are generated in the PC using Matlab tools. The values of the corrosion factor measured in different durations of exposure to atmosphere, which obey a bilogarithmic law, testify to the validity of our mathematical model.

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Reference

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