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Journal of Zhejiang University SCIENCE B 2005 Vol.6 No.11 P.1135~1140

10.1631/jzus.2005.B1135


Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contacts


Author(s):  ZHAO Yue, LI Dong-sheng, XING Shou-xiang, YANG De-ren, JIANG Min-hua

Affiliation(s):  State Key Lab of Silicon Materials, Zhejiang University, Hangzhou 310027, China; more

Corresponding email(s):   zhaoyue1976@sohu.com

Key Words:  Porous silicon, Morphology, Electrical properties


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ZHAO Yue, LI Dong-sheng, XING Shou-xiang, YANG De-ren, JIANG Min-hua. Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contacts[J]. Journal of Zhejiang University Science B, 2005, 6(11): 1135~1140.

@article{title="Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contacts",
author="ZHAO Yue, LI Dong-sheng, XING Shou-xiang, YANG De-ren, JIANG Min-hua",
journal="Journal of Zhejiang University Science B",
volume="6",
number="11",
pages="1135~1140",
year="2005",
publisher="Zhejiang University Press & Springer",
doi="10.1631/jzus.2005.B1135"
}

%0 Journal Article
%T Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contacts
%A ZHAO Yue
%A LI Dong-sheng
%A XING Shou-xiang
%A YANG De-ren
%A JIANG Min-hua
%J Journal of Zhejiang University SCIENCE B
%V 6
%N 11
%P 1135~1140
%@ 1673-1581
%D 2005
%I Zhejiang University Press & Springer
%DOI 10.1631/jzus.2005.B1135

TY - JOUR
T1 - Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contacts
A1 - ZHAO Yue
A1 - LI Dong-sheng
A1 - XING Shou-xiang
A1 - YANG De-ren
A1 - JIANG Min-hua
J0 - Journal of Zhejiang University Science B
VL - 6
IS - 11
SP - 1135
EP - 1140
%@ 1673-1581
Y1 - 2005
PB - Zhejiang University Press & Springer
ER -
DOI - 10.1631/jzus.2005.B1135


Abstract: 
This paper reports the surface morphology and I-V curves of porous silicon (PS) samples and related devices. The observed fabrics on the PS surface were found to affect the electrical property of PS devices. When the devices were operated under different external bias (10 V or 3 V) for 10 min, their observed obvious differences in electrical properties may be due to the different control mechanisms in the Al/PS interface and PS matrix morphology.

Darkslateblue:Affiliate; Royal Blue:Author; Turquoise:Article

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