| index | Title |
| 1 | Fine-grained checkpoint based on non-volatile memory Author(s):Wen-zhe Zhang, Kai Lu, Mikel LUJÁ... Clicked:9950 Download:4395 Cited:0 <Full Text> <PPT> 2464 Frontiers of Information Technology & Electronic Engineering 2017 Vol.18 No.2 P.220-234 DOI:10.1631/FITEE.1500352 |
| 2 | Versionized process based on non-volatile random-access memory for fine-grained fault tolerance Author(s):Wen-zhe Zhang, Kai Lu, Xiao-ping W... Clicked:9830 Download:4595 Cited:0 <Full Text> <PPT> 2224 Frontiers of Information Technology & Electronic Engineering 2018 Vol.19 No.2 P.192-205 DOI:10.1631/FITEE.1601477 |
| 3 | A novel non-volatile memory storage system for I/O-intensive applications Author(s):Wen-bing Han, Xiao-gang Chen, Shun... Clicked:6661 Download:4398 Cited:0 <Full Text> <PPT> 2523 Frontiers of Information Technology & Electronic Engineering 2018 Vol.19 No.10 P.1291-1302 DOI:10.1631/FITEE.1700061 |
| 4 | Enhancing security of NVM-based main memory with dynamic Feistel network mapping Author(s):Fang-ting Huang, Dan Feng, Wen Xia... Clicked:10087 Download:4901 Cited:0 <Full Text> <PPT> 2744 Frontiers of Information Technology & Electronic Engineering 2018 Vol.19 No.7 P.847-863 DOI:10.1631/FITEE.1601652 |
| 5 | NEHASH: high-concurrency extendible hashing for non-volatile memory Author(s):Tao CAI, Pengfei GAO, Dejiao NIU, ... Clicked:4199 Download:6283 Cited:0 <Full Text> <PPT> 1037 Frontiers of Information Technology & Electronic Engineering 2023 Vol.24 No.5 P.703-715 DOI:10.1631/FITEE.2200462 |
| 6 | NICFS: a file system based on persistent memory and SmartNIC Author(s):Yitian YANG, Youyou LU Clicked:3991 Download:3543 Cited:0 <Full Text> <PPT> 1055 Frontiers of Information Technology & Electronic Engineering 2023 Vol.24 No.5 P.675-687 DOI:10.1631/FITEE.2200469 |
| 7 | MyWAL: performance optimization by removing redundant input/output stack in key-value store Author(s):Xiao ZHANG, Mengyu LI, Michael NGU... Clicked:4529 Download:4707 Cited:0 <Full Text> <PPT> 1108 Frontiers of Information Technology & Electronic Engineering 2023 Vol.24 No.7 P.980-993 DOI:10.1631/FITEE.2200496 |